IEC 60749-33 Ed. 1.0 标准详情
- 标准号:IEC 60749-33 Ed. 1.0
- 中文标题:
- 英文标题:Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
- 标准类别:国际电工委员会IEC
- 发布日期:
The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated test which employs
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