IEC 60749-30 Ed. 1.0 标准详情
- 标准号:IEC 60749-30 Ed. 1.0
- 中文标题:
- 英文标题:Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
- 标准类别:国际电工委员会IEC
- 发布日期:
Establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing. The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative of a typ
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