IEC 60749-13 Ed. 1.0 标准详情
- 标准号:IEC 60749-13 Ed. 1.0
- 中文标题:
- 英文标题:Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
- 标准类别:国际电工委员会IEC
- 发布日期:
Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices
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