IEC 60749-24 Ed. 1.0 标准详情
- 标准号:IEC 60749-24 Ed. 1.0
- 中文标题:
- 英文标题:Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
- 标准类别:国际电工委员会IEC
- 发布日期:
The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to acce
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