IEC 60749 Ed. 2.2 标准详情
- 标准号:IEC 60749 Ed. 2.2
- 中文标题:
- 英文标题:Semiconductor devices - Mechanical and climatic test methods
- 标准类别:国际电工委员会IEC
- 发布日期:
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental pro
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