BS ISO 17470-2014 微束分析,电子探针,指南用波长色散X射线光谱定性分析点
BS ISO 17470-2014 标准详情
- 标准号:BS ISO 17470-2014
- 中文标题:微束分析,电子探针,指南用波长色散X射线光谱定性分析点
- 英文标题:Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
- 标准类别:英国标准BS
- 发布日期:31 January 2014
内容简介
Provides guidance for the identification of elements and the investigation of the presence of specific elements, within a specific volume (on a (mu)m[3] scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X
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