OVE/ONORM EN 62047-8-2012 标准详情
- 标准号:OVE/ONORM EN 62047-8-2012
- 中文标题:
- 英文标题:Semiconductor Devices - Micro-Electromechanical Devices - Part 8: Strip Bending Test Method For Tensile Property Measurement Of Thin Films (Iec 62047-8:2011)
- 标准类别:奥地利国家标准ONORM
- 发布日期: