NEN ISO 14606-2000 标准详情
- 标准号:NEN ISO 14606-2000
- 中文标题:
- 英文标题:Surface Chemical Analysis - Sputter Depth Profiling - Optimization Using Layered Systems As Reference Materials
- 标准类别:荷兰国家标准NEN
- 发布日期:
Provides guidance on the optimization of sputter-depth profiling parameters using appropriate single-layered and multilayered reference materials in order to achieve optimum depth resolution as a function of instrument settings in Auger electron spec
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