OVE/ONORM EN 60749-30-2012 标准详情
- 标准号:OVE/ONORM EN 60749-30-2012
- 中文标题:
- 英文标题:Semiconductor Devices - Mechanical And Climatic Test Methods - Part 30: Preconditioning Of Non-Hermetic Surface Mount Devices Prior To Reliability Testing (Iec 60749-30:2005 + A1:2011)
- 标准类别:奥地利国家标准ONORM
- 发布日期: