ASTM F76-1986(1996)e1 测量单晶半导体的电阻率、霍尔系数及霍尔迁移率的试验方法
ASTM F76-1986(1996)e1 标准详情
- 标准号:ASTM F76-1986(1996)e1
- 中文标题:测量单晶半导体的电阻率、霍尔系数及霍尔迁移率的试验方法
- 英文标题:Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
- 标准类别:美国材料与试验协会ASTM
- 发布日期:1986
内容简介
1.1 These test methods cover two procedures for measuring the resistivity and Hall coefficient of single-crystal semiconductor specimens. These test methods differ most substantially in their test specimen requirements.1.1.1 Test Method A, van der Pa
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