IEC 60749-6 Ed. 1.0 标准详情
- 标准号:IEC 60749-6 Ed. 1.0
- 中文标题:
- 英文标题:Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
- 标准类别:国际电工委员会IEC
- 发布日期:
Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive. The contents of the corrigendum of August 2003 have bee
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