ASTM F1262M-2014 标准详情
- 标准号:ASTM F1262M-2014
- 中文标题:标准指南数字集成电路的瞬态辐射翻转阈值测试(公制)
- 英文标题:Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
- 标准类别:美国材料与试验协会ASTM
- 发布日期:06 January 2014
Scope 1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 103 Gy (matl.)/s. 1.1.1 Discussion—
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