IEC 60749 Edition 2.2-2002 标准详情
- 标准号:IEC 60749 Edition 2.2-2002
- 中文标题:半导体器件 - 机械和气候试验方法
- 英文标题:Semiconductor devices - Mechanical and climatic test methods
- 标准类别:国际电工委员会IEC
- 发布日期:2002-04
This International Standard lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. However, additional test methods may be required for non-cavity devices.NOTE A non-cavit
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