IEC 60749-18 Ed. 1.0 标准详情
- 标准号:IEC 60749-18 Ed. 1.0
- 中文标题:
- 英文标题:Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
- 标准类别:国际电工委员会IEC
- 发布日期:
Provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source. Proposes an accelerated anne
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