IEC 62047-22 Ed. 1.0 标准详情
- 标准号:IEC 62047-22 Ed. 1.0
- 中文标题:
- 英文标题:Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates
- 标准类别:国际电工委员会IEC
- 发布日期:
IEC 62047-22-2014 Semiconductor devices. Micro-electromechanical devices. Part 22:Electromechanical tensile test method for conductive thin films on flexible substrates specifies a tensile test method to measure electromechanical properties of conduc
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