EIA JESD 22-A103-2010 标准详情
- 标准号:EIA JESD 22-A103-2010
- 中文标题:
- 英文标题:High Temperature Storage Life
- 标准类别:美国电子工业协会EIA
- 发布日期:
Applies for evaluation, screening, monitoring, and/or qualification of all solid state devices. High Temperature storage test is typically used to determine the effect of time and temperature, understorage conditions, for thermally activated failure
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