IEEE 1149.1b-1994 标准详情
- 标准号:IEEE 1149.1b-1994
- 中文标题:存取端和扫描范围结构的测试
- 英文标题:Test access port and boundary-scan architecture
- 标准类别:国际电工协会IEEE
- 发布日期:1994-09-22
Defines test logic that can be included in an integrated circuit to provide standardized approaches to: a) testing the interconnections between integrated circuits once they have been assembled onto a printed circuit board or other substrate; b) test
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