IEC 60749-34 Ed. 1.0 标准详情
- 标准号:IEC 60749-34 Ed. 1.0
- 中文标题:
- 英文标题:Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
- 标准类别:国际电工委员会IEC
- 发布日期:
Used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of the internal semiconductor die and internal connectors. This happens when low-voltage operating biases for forward c
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