DIN 50440 T.1-1981 标准详情
- 标准号：DIN 50440 T.1-1981
- 中文标题：半导体工艺材料的检验.用光电导法测量硅单晶中复合载流子寿命.在方形试样上测量
- 英文标题：Testing of materials for semiconductor technology; measurement of recombination carrier lifetime in silicon single crystals by means of photo conductive decay method; measurement on bar-shaped specimens
- 标准类别：德国标准
- 发布日期：
