ASTM F980-2010e1 标准详情
- 标准号:ASTM F980-2010e1
- 中文标题:标准指南中子感应位移故障的快速退火的测量硅半导体器件
- 英文标题:Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
- 标准类别:美国材料与试验协会ASTM
- 发布日期:12 January 2010
Scope 1.1 This guide defines the requirements and procedures for testing silicon discrete semiconductor devices and integrated circuits for rapid-annealing effects from displacement damage resulting from neutron radiation. This test will produ
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