EIA JESD 22 A108-2005 标准详情
- 标准号:EIA JESD 22 A108-2005
- 中文标题:温度,偏置,和运行寿命
- 英文标题:Temperature, Bias, And Operating Life
- 标准类别:美国电子工业协会EIA
- 发布日期:
Determines the effects of bias conditions and temperature, over time, on solid state devices is now available. Includes low temperature operating life (LTOL) and high temperature gate bias (HTGB) stress conditions, revised cool down requirements for
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