ASTM E1438-1991(1996) 标准详情
- 标准号:ASTM E1438-1991(1996)
- 中文标题:用次级离子质谱法(SIMS)测量溅射深度成形界面的宽度
- 英文标题:Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
- 标准类别:美国材料与试验协会ASTM
- 发布日期:1991
1.1 This guide provides the SIMS analyst with a method for determining the width of interfaces from SIMS sputtering data obtained from analyses of layered specimens. This guide does not apply to data obtained from analyses of specimens with thin mark
* 特别声明:资源收集自网络或用户上传,本网站所提供的电子文本仅供参考,请以正式出版物为准。仅供个人标准化学习,研究使用。如有侵权,请及时联系我们!