NEN 10747-11-1986 标准详情
- 标准号:NEN 10747-11-1986
- 中文标题:
- 英文标题:Semiconductor Devices - Part 11: Sectional Specification For Discrete Devices
- 标准类别:荷兰国家标准NEN
- 发布日期:
Gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, tests and measurement procedures required for the assessment of semiconductor devices.
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