ASTM E1162-1987(2001) 标准详情
- 标准号:ASTM E1162-1987(2001)
- 中文标题:二次离子质谱法(SIMS)中报告溅射深度截面数据
- 英文标题:Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
- 标准类别:美国材料与试验协会ASTM
- 发布日期:1987
1.1 This practice covers the information needed to describe and report instrumentation, specimen parameters, experimental conditions, and data reduction procedures. SIMS sputter depth profiles can be obtained using a wide variety of primary beam exci
* 特别声明:资源收集自网络或用户上传,本网站所提供的电子文本仅供参考,请以正式出版物为准。仅供个人标准化学习,研究使用。如有侵权,请及时联系我们!